Investigation the properties of nanostructured materials
Keywords:
nanostructured materials, energy dispersive spectroscopy, energy dispersive X-ray spectroscopy, elementsAbstract
Elements have various characteristics that require precise tools and devices to determine each of them, EDS (Energy Dispersive Spectroscopy) system, or (Energy Dispersive X-ray Spectroscopy) EDAX or as a tool for energy dispersive spectroscopy and system ( Wavelength Dispersive X-ray Spectroscopy (WDS) is introduced as wavelength dispersive spectroscopy. These systems are used as peripheral equipment of the scanning electron microscope (SEM). In EDS spectroscopy, by measuring the energy of X-rays emitted from the sample, it is possible to examine the sample quantitatively and qualitatively. In WDS spectroscopy, the emitted X-ray waves are classified and separated based on wavelength and analyzed. Using these methods, quantitative and qualitative analyzes can be performed on the sample, and the type and amount of elements in the sample can be determined.
References
Goldstein, J. I.; Newbury, D. E.; Echlin, P.; Joy, D. C.; Lyman, C. E.; Lifshin, E.; Sawyer, L.C.; Michael, J. R. (2003) , Scanning Electron Microscopy and X-Ray Microanalysis, Springer, ISBN 0306472929.
http://www.microanalytical.com/sem.html.
Egerton,R. F. (2005) Physical principles of electron microscopy: an introduction to TEM, SEM, and AEM. Springer, 202.
Reimer, L. (1998) Scanning Electron Microscopy: Physics of image formatiClarke, A. R. (2002) Microscopy techniques for materials science. CRC press (electronic resource)
